Time: 8:30am - 4:45pm (8:30am-11:00am on last day)
Embassy Suites Hotel, 150 Anza Blvd.
Burlingame, California 94010
This course is designed for engineers who are using ASPEN OneLiner to perform short circuit and relay coordination studies and wish to become more proficient in using the program. The course material is intended for users of all levels. The class will include hands-on training of System Modeling, Short Circuit Studies and Protective Equipment Studies.
Topics
- OneLiner user interface.
- Network modeling: Generators, transmission lines, transformers, MOV-protected series capacitors, zero sequence mutuals, current-limited generator model for wind turbines, PV and non-traditional generation sources.
- Short Circuit Calculations: starting voltage assumptions, outaged and grounded lines, circulating current in wye-wye-delta transformer, phasor probe, simultaneous faults, batch fault simulation.
- Overcurrent and distance relay protections modeling. Plotting transformer-damage and inrush curves. and relay library editors. Importing relay data from SEL 5010, 5030 and other manufacturers' relay data files.
- Communication-assisted protection scheme model.
- Relay coordination studies, automatic coordination checking functions.
- Special applications: breaker rating module, acr-flash hazard calculator, stepped event simulation.
- Special topics: fault location, export relay test file, boundary equivalent, ground current calculator.
- File management techniques.
- Program installation: network keys, file sharing, work group setup.
Instructors
Sherman Chan received his BS degree from Harvey Mudd College and his PhD degree from M.I.T., both in engineering. He worked at Bonneville Power Administration and at System Control, Inc. before founding ASPEN in 1986. Sherman is a Senior Member of IEEE.
Thanh Nguyen received his BS and MS degrees in Nuclear Power Engineering from Moscow Power Engineering Institute in Russia and a PhD degree in power system at the University of Wisconsin at Milwaukee. Thanh is a member of IEEE.
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